Hamamatsu Camera Newsletter Solar Devices

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Quick-Navigation: ORCA R2 - TDI Engine - Luminescence detection for solar device analysis
Luminescence detection for solar device analysis Optimization of production process
Photo- and Electroluminescence are more and more becoming highly valuable methods for characterizing wafer, solar cells and solar panels.
	Image: PL image of raw multicrystalline Si wafer acquired by C9100-14
The benefits of using an Electron Multiplier camera like the Hamamatsu C9100-14 for those applications are manifold: high sensitivity in the NIR range to allow short exposure times high gain and high frame rate to achieve short measurement interval low noise to achieve high measurement accuracy Electroluminescence (EL) and Photoluminescence(PL) are used to analyze various characteristics and defects Material Failures Shunts Crystalline failures Cracks Contamination Thin-film defects Process failures Metallization failures Efficiency mapping PL is applicable not only to processed wafer or modules, but it can also be applied for bare wafer and for wafer under production process EL and PL are powerful methods for defect analysis and quality analysis in solar cell production. Datasheet

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