| Part Number |
C9920-12 |
| Name of product |
Quantum Yield Measurement System |
| Brief description |
This system measures the External Quantum Efficiency of samples by EL method. |
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Full description |
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It consists of a constant current power supply for excitation, an integrating sphere as sample chamber and a multi channel analyzer for signal detection. In this way the overall emission efficiency (including e.g. the glass substrate and not only the emissive layer) is determined. Due to the use of the integration sphere the measurement does not depend on the emission angle characteristics of the sample. |
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Features |
- Due to the use of an integration sphere the measurements are not influenced by the emission pattern characteristics of the sample
- Highly sensitive detector (300 nm  950 nm)
- Instantaneous measurement of the whole emission spectrum
- Source meter (Keithley 2400) is software controlled
- Easy handling
- Dedicated software for controlling the hardware, data acquisition and data processing
- The system can easily be extended to measuring absolute quantum yields (C9920-02) or light distribution and brightness (C9920-11)
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Applications |
- Development of LEDs
- Improvement of LED construction
- Characterization of electroluminescent samples
|
| Standards Compliance |
CE |
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