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Si-Ingot inspection


For inspection of silicon ingots cameras with high sensitivity in the near infrared range are required. Depending on the detailed requirements TDI or 2-D array cameras may be used. The inspection results show defects within the ingot, such as inclusions, major crystal defects, voids etc.
 

Part Number
 
Name of product
 
Wavelength (min.)
 nm  
Wavelength (max.)
 nm  
Active pixels
 
Frame rate (max.)
 fps  
Data interface
 
C10633-34   Near Infrared Camera 900 1520 640 (H) x 512 (V) 1.6 RS232C
C10633   Near Infrared Camera 900 1520 320 (H) x 256 (V) 60 USB 2.0
C10000-401   Time Delay Integration Camera 200 1200 2048(H) x 128(V) 50kHz Line Rate Camera Link
C10000-301   Time Delay Integration Camera 200 1120 1024(H) x 128(V) 50kHz Line Rate Camera Link
Part Number
Name of product
Wavelength (min.)
Wavelength (max.)
Active pixels
Frame rate (max.)
Data interface
 
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