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Measurement of film thickness is an important task during solar cell manufacturing. The Optical NanoGauge system is based in an interfrometric method. It measures the thickness of each film layer in a thin film cell by making use of spectral interfeometry. Even organic films can be measured. By the optional mapping system film thickness distribution can be measured as well.
 

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C10178 Series    Optical NanoGauge for macro measurement Provides non-contact, real time measurement of thin film thickness from 20 nm to 50µm with fast and easy operation
C10000-701B    TDI Camera High Speed, Time Delay Integration Camera, (Dynamic Range 800:1 and 12 bit A/D Converter)
C10000-701A    TDI Camera High Speed, Time Delay Integration Camera, (Dynamic Range 256:1 and 8 bit A/D Converter)
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