While EL and PL are typically applied to observe the emission from a relatively large area (whole solar cell or whole solar panel), there is also a need to do microscopic analysis of electro- and photoluminescence signals. Especially for detailed root cause defect analysis. These techniques have been successfully applied in the semiconductor industry for more than 20 years.
Hamamatsu offers emission- and laser scan microscope systems dedicated for the microscopic analysis. They can be equipped with highly sensitive cameras for detection of light emission signals in the near infrared region. Additionally laser scan techniques with laser stimulation in the near IR range are available. A third technique is based on thermal signal analysis.
