Hamamatsu provides the semiconductor industry with high-quality microscope systems for failure analysis. These systems include IR confocal emission microscopes, inverted emission microscopes, laser stimulation and IR-OBIRCH microscopes, thermal emission microscopes, and time-resolved imaging emission microscopes. Products include:  

Failure analysis microscope systems

Our failure analysis tools are suited for a wide variety of architecture from the die or wafer level, to package or applications board level, up to probe card level and direct docking with tester environment.

For over 50 years, Hamamatsu has been a reliable supplier to scientific and research institutions, industry, and OEMs. We offer high-quality photonics products; excellent technical support; customizable products; reliable, on-time delivery; quantity pricing for OEM customers; and long-term availability of parts over many years.